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Scalable High-Speed Digital Test Technology |
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The DJ60HS is DFT Microsystems’ second generation high-speed test module. It builds on the company’s miniature test technology, and it provides a platform for tremendous design flexibility. Through a smart blend of reconfiguration (personality) and measurement technology, the module is protocol-adaptable to allow rapid support for high-speed application test. Click on the diagram for further details. |
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Applications and Benefits Easily integrates with your existing ATE Enables seamless correlation between lab and ATE Self-contained multi-lane solution |
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Features Data rates of up to 6.4 Gbps Eight transmit and eight receive lanes Built-in jitter insertion on all lanes Built-in jitter measurement on all lanes Functional pattern support Flexible loop-back capability All in a compact size. Learn more > |
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Features | Overview | ATE Integration | Specifications |